Differentiated Data and World-Class Big Data Analytics

Rather than be limited by the types and amount of data available to solve problems. PDF Solutions invented new ways to generate and collect differentiated data that would enable the company to help customers lower the total cost of IC design and manufacturing, accelerate time to market, and improve overall product quality and reliability.

We are the acknowledged industry leader in characterization, and our Characterization Vehicle® (CV®) test chips are used by more leading manufacturers than any other test chips in the industry. As more semiconductor devices use 3D structures, our DFITM System can generate differentiated data that can detect electrically-relevant buried defects during middle-of-line manufacturing, reducing time-to-market by 4 to 6 months.

Finally, our Exensio® Analytics Platform is the only end-to-end big data platform for yield management, fault detection and classification, test operations, and assembly & packaging. Combined with our differentiated data capabilities, this platform is improving yield and production control activities at leading fabs around the world, and is also improving yield, quality, and efficiency for IDMs and fabless semiconductor companies worldwide.

Our mission is to empower every foundry, OSAT, IDM, and fabless company to realize the promise of Industry 4.0 by breaking down the data silos within their supply chains and leverage all of their product lifecycle data to improve every key performance indicator (KPI) that is important to their business.

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