For fabless semiconductor companies who design their devices but rely on OSATs for test, assembly and packaging
Exensio Fabless collects and aligns data from their OSATs to provide product lifecycle data from test and assembly operations. As with all Exensio products, product lifecycle data is automatically collected through our DEX infrastructure and is immediately harmonized and ready for interactive analysis or to drive machine-learning algorithms.
With Exensio Fabless, customers can implement powerful rules-driven flows that raise product quality and improve test efficiency across their entire supply chain.
Focus on Your Product, not Data Management
With Exensio Fabless, customers can focus their time and effort on the quality and robustness of their products and not worry about data collection and management. Our DEX infrastructure ensures that all OSAT test data is collected, cleaned and is ready for interactive or automated analysis within minutes of test completion.
In the example below, a product engineer is interested in the parameter NFPT and is running a char report against both temperature and voltage. In the upper right, is a comparison circle chart to see how the device performs at different temperatures. The Exensio Fabless dashboard can easily display information in multiple formats including box plots, summary tables, histograms and CDF plots.
All of this information can be displayed quickly and easily, and with the reporting module, automatically be turned into report, further reducing engineering time and effort on tasks that can be automated with Exensio Fabless.