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Resources

2025 – AI for Manufacturing and Test at SEMICON Taiwan

Posted on September 29, 2025 by PDF Solutions

tags: 
AI/ML
,
DFF
,
AI Driven Test

AI for Manufacturing and Test -The New Frontier Keynote Presentation at SEMICON Taiwan 2025

Speaker: Ming Zhang, PDF Solutions

Abstract:

The semiconductor industry stands at a pivotal moment, driven by the transformative forces of AI and chiplet technology. AI applications demand the seamless heterogenous integration of diverse chiplets: compute, memory, communication, and sensing. At the same time, the exponential growth in systemic complexity of chiplet-based designs generates an unprecedented volume of data across the design, manufacturing, and deployment phases of semiconductor products. This convergence presents a unique and vast opportunity to harness the power of data, through AI in semiconductor manufacturing and testing while posing significant challenges due to the distinct nature of semiconductor data. A number of technologies are coming together to increase the impact that AI can have on semiconductor manufacturing. Secure remote connections to equipment allow multiple parties to leverage equipment data to better optimize tools and processes leveraging AI based digital twin technology. Emerging Agentic AI approaches can deliver major improvements to process controls in particular when combined with LLM based AI for dramatic improvements in knowledge management for optimized incident response.

This presentation explores the evolving industry landscape, outlines our vision for leveraging AI in the manufacturing and testing of chiplets and systems, and addresses the critical challenges that remain in this exciting frontier.

Keywords: AI for Test, Data Feed Forward, AI techniques for modeling with low-volume data sets

Download the presentation today!

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Categories

  • Keynote Presentations
  • Published Papers

Tags

  • Cybersecurity
  • Supply Chain
  • Agentic AI
  • DFF
  • Chiplet ecosystem
  • OEE
  • AI Driven Test
  • Data & Annalytics
  • Secure Data
  • Predictive Learning
  • Secure Remote Connection
  • Digital Twin
  • Smart Manufacturing
  • SEMI Standards
  • Multi-Agent Workflows
  • Data Integration
  • Metrology
  • Electric vehicles
  • Manufacturing Analytics
  • Silicon Carbide
  • Yield Management
  • e-Beam
  • Voltage Contrast
  • Modeling
  • Characterization
  • Design for Manufacturing
  • Compound Semiconductors
  • Manufacturing
  • Process Control
  • AI/ML
  • Data
  • Parametric Test
  • Emerging Memories
  • FDC

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