« All Events This event has passed. APCSM 2020 October 6, 2020 « Known Good Die (KGD) Workshop 2020 NANO Testing Symposium 2020 » Paper: Combining Machine Learning with Advanced Outlier Detection to Improve Quality and Lower Cost Presenter: Tomonori Honda, Fellow Time: 3pm CDT – Tuesday, October 6, 2020 Add to calendar Google Calendar iCalendar Outlook 365 Outlook Live Details Date: October 6, 2020 Website: http://www.cvent.com/events/apcsm-conference-xxxii-2020/event-summary-92a00ecab7f0497faf59d76a28005013.aspx Venue Virtual Event Organizer IMA Phone 512-423-5516 Email vaneck@apcconference.com