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  • Why PDF Solutions
  • Products
    • Exensio® Analytics Platform
      • Exensio Battery
    • Sapience™
    • Advanced Insights for Manufacturing
    • Design-for-Inspection™ System
    • Characterization Vehicle® System
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Blog

Exensio Aurora, a new highly scalable architecture for PDF Solutions Exensio – four reasons leading to its development.

At the PDF Solutions CONNECT event to be held on October 15–16 in San Francisco, CA. PDF Solutions will present and demonstrate Exensio® Aurora, a new highly scalable architecture for …

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Proven Connectivity Excellence

David Warren

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AI in Production: What It Really Takes to Improve Semiconductor Cost and Quality?

Steve Zamek

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The Future of Semiconductor Manufacturing: Key Takeaways from PDF Solutions Users Conference 2025

PDF Solutions

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DirectScan™: Redefining E-Beam Inspection for Next-Generation Semiconductors

Indranil De

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Scaling Intelligence: PDF Solutions’ Vision for AI-Driven Semiconductor Manufacturing Analytics

PDF Solutions

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Supporting the semiconductor Industry through AI-driven Collaboration and Smarter Decisions

PDF Solutions

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North America Information & Control Committee Winter 2026 Update

Brian Rubow

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How Gate and Fin Spacing Variations Impact FinFET Performance: New Insights from 7nm Technology

Angelo Rossoni

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Enabling Smart Manufacturing: The Critical Role of SEMI Industry Standards

Alan Weber

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Why CIMControlFramework?

David Warren

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Solving ML’s Class Imbalance Problem in Semiconductor Testing

Sanjana Gajendran

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Predicting Yield Loss from Source: Machine Learning for Compound Semiconductor Manufacturing

Tzu-Hsuan Chen

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