Advantest® and PDF Solutions® Announce Partnership to Build Advantest Cloud Powered by PDF Exensio®

Press Release

Advantest® and PDF Solutions® Announce Partnership to Build Advantest Cloud Powered by PDF Exensio®

Press Release

07/30/2020

Management Summary: PDF Solutions and Advantest Partnership

High-level summary and analysis of the partnership between PDF Solutions and Advantest

View Summary

More than data insight, we provide data FORESIGHT

Leaders can accurately predict outcomes, long before others even recognize a trend is occurring. Semiconductor manufacturing success in the era of Industry 4.0 requires the ability to integrate data across the entire product lifecycle and apply predictive analytics at the edge to positively impact future outcomes such as yield, quality, and reliability.

fore•sight /fôr'sīt"/The ability or actions of imagining or anticipating what might happen in the future

Best-in-Class Big Data
Analytics Platform

The Exensio® Analytics Platform supports hundreds of data formats from FDC, Yield, Test, Assembly, & Packaging and harmonizes all of that data into a single, semantic data model that is immediately ready for interactive analytics and machine-learning applications, transforming your data into actionable intelligence to improve your yield, quality, and profitability.

We Deliver Results

80%

Less Data Wrangling

Spend time finding answers instead of collecting and cleaning your data

50%

Faster Yield Learning

Accelerate time to market for all your products

50%

Fewer Quality Excursions

Meet aggressive quality goals without sacrificing yield

Advanced Insights For Manufacturing

Integrated Yield Ramp

Design For Inspection

Get More Out of Your Data

PDF Solutions provides additional offerings to help customers achieve specific outcomes. These solutions include the use of Machine Learning (e.g. predicting Early Life Failures), Characterization Vehicles® to accelerate yield learning for advanced process nodes and derivative legacy nodes, and next-generation Design For Inspection™ solutions that identify critical electrical manufacturing issues months before any other methodologies.

Services

"We were able to significantly improve our test operations efficiency and first pass yield using the Exensio dashboarding capability”
Dr. Wei-Chung Wang Fairchild Sr. VP of Manufacturing Operations

“We look forward to leveraging the entire Exensio platform with the Exensio-Yield and Exensio-Control modules, to optimize our chip yields and realize its direct positive impact on our profitability.”
Bob Lima Director of Assembly and Test Operations at Peregrine Semiconductor

"The new features and the single platform approach of Exensio are critical for the success of our new product introductions, enabling us to drive our manufacturing process to higher yields, higher efficiency, and help our customers get to market quickly.”
Kevin Haskew Sr VP and CIO at ON Semiconductor

"After benchmarking the current market offers and testing a real implementation of mæstria® in our Reutlingen facility, we drew the conclusion that mæstria® is the best adapted FDC solution to our fabrication environment."
Thorsten Widmer Vice President of Semiconductor Plant at Robert Bosch GmbH

"After an extensive evaluation and actual usage, we found mæstria® and dataPOWER® to be the best stand-alone FDC and YMS products on the market today."
Walter Mente Vice President Operations at austriamicrosystems