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October 2019

Advanced Process Control Conference 2019

October 3, 2019 @ 8:00 am - 5:00 pm
Embassy Suites Riverwalk San Antonio, 125 E. Houston Street
San Antonio, TX 78205 United States
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November 2019

International Test Conference 2019

November 12, 2019 - November 14, 2019
Marriott Washington Wardman Park, 2660 Woodley Road, NW
Washington, DC, DC 20008 United States
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Visionary Keynote: The Outlook for Manufacturing Test in a Future Driven by Big Data Analytics and the IIoT John Kibarian CEO and Co-Founder Date/Time TBD

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ICCAD

November 21, 2019 - November 23, 2019
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December 2019

SEMICON Japan 2019

December 11, 2019 - December 13, 2019
Tokyo Big Sight, 3 Chome-11-1 Ariake, Koto City
Tokyo, 135-0063 Japan
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Invited Presentation: Smart Factory realization through common semantic data models and production-proven AI Mike Keleher, Sales General Manager, Japan Date/time is TBD

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March 2020

APC-M Europe

March 30 - April 1
TOULON Palais des Congr’s Neptune, Avenue de Besagne
Toulon, France
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April 2020

VLSI Test Symposium

April 6 - April 8
Hyatt Regency Mission Bay Spa and Marina, 1441 Quivira Rd
San Diego, CA 92109 United States
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May 2020

Craig-Hallum Conference

May 27
Virtual Event due to COVID-19, Invitation Only

Presenter: Adnan Raza, VP of Finance and CFO, PDF Solutions

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June 2020

ESD Alliance 2020 CEO Outlook

June 17 @ 10:30 am - 12:00 pm

Panelist: John Kibarian, CEO and co-founder, PDF Solutions

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Webinar: Smart Manufacturing in the Fab

June 24 @ 10:00 am - 11:00 am

In this free webinar, attendees will learn how to apply production-proven Smart Manufacturing technologies to their existing semiconductor manufacturing equipment and yield data to create an intelligent system that can automatically detect, identify, and act on process flow or tool problems during IC manufacturing. Attendees will also learn how feedback in the system is used to identify the critical sensors, and how modeling can be used to identify multivariate factors that impact key performance indicators like defectivity, yield, or electrical performance.

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