Published Papers Tagged: Yield Management

Published Paper

2025 – End-to-End Yield Management for Compound Semiconductors Manufacturing

Compound Semiconductors

Silicon Carbide

Manufacturing Analytics

Yield Management

Published Paper

2025-Product Design Enhancement with Test Structures for Non-Contact Detection of Yield Detractors

Yield Management

e-Beam

Design for Manufacturing

Characterization

Published Paper

2024 – Expediting manufacturing safe launch with Big Data AI/ML analytic solutions on the cloud

Yield Management

Manufacturing

Published Paper

EDTM 2022 – Novel E-beam Techniques for Inspection and Monitoring

Yield Management

e-Beam

Published Paper

IEEE S3S 2019 – Characterization Challenges and Solutions for FDSOI Technologies

Yield Management

Published Paper

IEEE Transactions 2015 – Contact Chains for FinFET Technology Characterization

Characterization

Yield Management

Published Paper

AEC/APC Symposium Asia 2009 – Online Deployment of Robust Metrology Prediction Model

FDC

Yield Management

Published Paper

SPIE 2009 – Simplify to Survive, prescriptive layouts ensure profitable scaling to 32nm and beyond

Design for Manufacturing

Yield Management

Published Paper

SPIE 2009 – OPC Simplification and Mask Cost Reduction Using Regular Design Fabrics

Design for Manufacturing

Yield Management

Published Paper

ISSM 2008 – BEOL parametric variation control with FDC data

Yield Management

Predictive Learning

FDC

Published Paper

IEEE Transactions 2008 – Variation in Transistor Performance and Leakage in Nanometer-Scale Technologies

Characterization

Design for Manufacturing

Yield Management

Published Paper

ASMC 2007 – Yield Modeling with Rule Ensembles

Predictive Learning

Yield Management