Pragmatic: We’re Doing Semiconductors Differently – Download

Pragmatic Semiconductor, a UK-based pioneer in flexible integrated circuits and recipient of Europe’s largest semiconductor venture funding raise, is transforming how fabs approach yield management and process control through smarter FDC analysis with Exensio. By deploying PDF Solutions’ Exensio®  Manufacturing Analytics (E-MA) and Process Control (E-PC) modules fab-wide, Pragmatic’s engineering teams can correlate FDC sensor data directly with yield, defect, and metrology datasets — turning hours of manual investigation into minutes. Real-world case studies show how the FDC2YMS Analyser pinpointed a helium leak causing wafer-level yield loss, the WQR Tool Matching capability caught a newly installed tool operating out of spec before vendor warranties expired, and FDC-driven OCAP workflows contained deposition arc excursions and wet etch filter failures in real time — all with statistical and physical validation built in. The result: faster root cause identification, proactive tool maintenance, and sustained yield improvement across the fab.

Ready to see how Pragmatic is doing semiconductors differently? Download the full below.