[gtranslate]
Published Papers
Published Papers
Published Paper
IEEE JEDS 2019 – Design and Measurement Requirements for Short Flow Test Arrays to Characterize Emerging Memories
Published Paper
EDTM 2019 – Yield and Reliability Challenges at 7nm and Below
Published Paper
EDTM 2019 – Design and Measurement Requirements for Short Flow Test Arrays to Characterize Emerging Memories
Published Paper
IEEE Transactions 2015 – Contact Chains for FinFET Technology Characterization
Published Paper
AEC/APC Symposium Asia 2009 – Online Deployment of Robust Metrology Prediction Model
Published Paper
SPIE 2009 – Simplify to Survive, prescriptive layouts ensure profitable scaling to 32nm and beyond
Published Paper
SPIE 2009 – OPC Simplification and Mask Cost Reduction Using Regular Design Fabrics
Published Paper
ISSM 2008 – BEOL parametric variation control with FDC data
Published Paper
IEEE Transactions 2008 – Variation in Transistor Performance and Leakage in Nanometer-Scale Technologies
Published Paper
ASMC 2007 – Yield Modeling with Rule Ensembles
Published Paper
ICMTS 2006 – Scribe Characterization Vehicle Test Chip for Ultra-Fast Product Wafer Yield Monitoring
Categories
Tags
- Data
- Secure Data
- Data & Annalytics
- AI Driven Test
- OEE
- Chiplet ecosystem
- DFF
- Agentic AI
- Supply Chain
- Predictive Learning
- FDC
- Emerging Memories
- Parametric Test
- Compound Semiconductors
- AI/ML
- Process Control
- Manufacturing
- Electric vehicles
- Design for Manufacturing
- Characterization
- Modeling
- Voltage Contrast
- e-Beam
- Yield Management
- Silicon Carbide
- Manufacturing Analytics
Ready to get Started with PDF Solutions?
Learn how we can transform your manufacturing data into actionable intelligence and improve your product yield, quality, and reliability
Schedule A Demo Contact Us