Keynotes & Papers

Published Paper

IEEE JEDS 2019 – Design and Measurement Requirements for Short Flow Test Arrays to Characterize Emerging Memories

Characterization

Parametric Test

Published Paper

EDTM 2019 – Yield and Reliability Challenges at 7nm and Below

Design for Manufacturing

Characterization

Published Paper

EDTM 2019 – Design and Measurement Requirements for Short Flow Test Arrays to Characterize Emerging Memories

Characterization

Emerging Memories

Published Paper

IEEE Transactions 2015 – Contact Chains for FinFET Technology Characterization

Yield Management

Characterization

Published Paper

AEC/APC Symposium Asia 2009 – Online Deployment of Robust Metrology Prediction Model

FDC

Yield Management

Published Paper

SPIE 2009 – Simplify to Survive, prescriptive layouts ensure profitable scaling to 32nm and beyond

Yield Management

Design for Manufacturing

Published Paper

SPIE 2009 – OPC Simplification and Mask Cost Reduction Using Regular Design Fabrics

Yield Management

Design for Manufacturing

Published Paper

ISSM 2008 – BEOL parametric variation control with FDC data

Yield Management

FDC

Predictive Learning

Published Paper

IEEE Transactions 2008 – Variation in Transistor Performance and Leakage in Nanometer-Scale Technologies

Yield Management

Design for Manufacturing

Characterization

Published Paper

ASMC 2007 – Yield Modeling with Rule Ensembles

Yield Management

Predictive Learning

Published Paper

ICMTS 2006 – Scribe Characterization Vehicle Test Chip for Ultra-Fast Product Wafer Yield Monitoring

Yield Management

Characterization

Published Paper

ISSM 2006 – Method for fast and accurate calibration of litho simulator for hot spot analysis

Characterization

Yield Management

Design for Manufacturing