Keynotes & Papers
Keynotes & Papers
Published Paper
SPIE 2009 – OPC Simplification and Mask Cost Reduction Using Regular Design Fabrics
Published Paper
ISSM 2008 – BEOL parametric variation control with FDC data
Published Paper
IEEE Transactions 2008 – Variation in Transistor Performance and Leakage in Nanometer-Scale Technologies
Published Paper
ASMC 2007 – Yield Modeling with Rule Ensembles
Published Paper
ICMTS 2006 – Scribe Characterization Vehicle Test Chip for Ultra-Fast Product Wafer Yield Monitoring
Published Paper
ISSM 2006 – Method for fast and accurate calibration of litho simulator for hot spot analysis
Categories
Tags
- Cybersecurity
- Supply Chain
- Agentic AI
- DFF
- Chiplet ecosystem
- OEE
- AI Driven Test
- Data & Annalytics
- Secure Data
- Predictive Learning
- Secure Remote Connection
- Digital Twin
- Smart Manufacturing
- SEMI Standards
- Multi-Agent Workflows
- Data Integration
- Metrology
- Electric vehicles
- Manufacturing Analytics
- Silicon Carbide
- Yield Management
- e-Beam
- Voltage Contrast
- Modeling
- Characterization
- Design for Manufacturing
- Compound Semiconductors
- Manufacturing
- Process Control
- AI/ML
- Data
- Parametric Test
- Emerging Memories
- FDC
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