Published Papers Tagged: Characterization

Published Paper

2025-Product Design Enhancement with Test Structures for Non-Contact Detection of Yield Detractors

Yield Management

e-Beam

Design for Manufacturing

Characterization

Published Paper

IEEE JEDS 2019 – Design and Measurement Requirements for Short Flow Test Arrays to Characterize Emerging Memories

Characterization

Parametric Test

Published Paper

EDTM 2019 – Yield and Reliability Challenges at 7nm and Below

Design for Manufacturing

Characterization

Published Paper

EDTM 2019 – Design and Measurement Requirements for Short Flow Test Arrays to Characterize Emerging Memories

Characterization

Emerging Memories

Published Paper

IEEE Transactions 2015 – Contact Chains for FinFET Technology Characterization

Yield Management

Characterization

Published Paper

IEEE Transactions 2008 – Variation in Transistor Performance and Leakage in Nanometer-Scale Technologies

Yield Management

Design for Manufacturing

Characterization

Published Paper

ICMTS 2006 – Scribe Characterization Vehicle Test Chip for Ultra-Fast Product Wafer Yield Monitoring

Yield Management

Characterization

Published Paper

ISSM 2006 – Method for fast and accurate calibration of litho simulator for hot spot analysis

Characterization

Yield Management

Design for Manufacturing