Built for Industry 4.0
Real-time data analytics to maximize yield, improve equipment performance, and minimize waste in your semiconductor manufacturing environment. Can be used in parallel with existing process control tools. Bring up new fabs with matching performance to a baseline fab quickly and easily.
The Process Control (C-Ops) module is the market leader in FDC with over 40,000 manufacturing tools managed by P-Ops worldwide at 6”, 8” and 12” fabs. Support for hundreds of makes and models of semiconductor manufacturing equipment.
PDF Solutions has a unique top-down approach to fab modeling. Our fab-centric process control approach leverages both front-end and back-end data that is automatically collected and integrated via DEX (data exchange network) to provide powerful signature analysis and diagnostics. This approach enables more efficient deployment versus a “per tool” distributed deployment and enables decision and control at the tool and factory level.
Automated detection of excursion events with FDC tool sensor level diagnostics and drilldown to perform process and metrology shifts, parametric drift, preventative maintenance and consumable event detection.
One-step parameter screening with advanced diagnostics to drive response correlations to feedback to tool control (dynamic SPC) for yield, device parametrics, and metrology
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