24/7/365 Monitoring and Protection of Your Semiconductor Devices in Test Operations
Automatically collect, analyze and detect statistical changes in manufacturing test, assembly, and packaging operations that negatively affect product yield, quality, or reliability, wherever those operations occur
Download the Test Operations datasheet
Deployed Worldwide – Over 4,000 testers
The Test Operations (T-Ops) module supports the broadest range of current and legacy testers in the industry and is managing over 4,000 testers in OSATs and IDMs worldwide. All the test operations data is collected automatically and is ready for interactive or rules-based analytics via DEX
Higher Quality and Reliability
Test Operations is the final gatekeeper before your devices are send to your customers and into the supply chain. It is critical to have a platform that can scale with your data and provide powerful and flexible rules and analytics necessary to meet your customer requirements. T-Ops supports multiple algorithms for Part Average Test (PAT) such as GDBN, NNR, DPAT, SPAT and Clustering
Greater Test Efficiency, Lower Test Costs
Test Operations helps increase test throughput by providing insight into tester and test program efficiency. 24/7/365 monitoring of your internal or external test operations ensures that you are achieving maximum throughput of good die to meet your contractual obligations
Support Customers of All Sizes
Unlike offerings from other companies, Test Operations (as part of Exensio Fabless or Exensio IDM) is scalable from small, startup companies to Fortune 500 organizations. We have a global integration team that is highly experienced and can initiate rapid deployment and integration of Test Operations into your test environment (IDM or OSAT) in a very short period of time.
Quick Highlights of Test Operations
- Broad support for current and legacy testers
- Bi-directional tester control
- Automated data collection and cleaning via DEX
- Big data analytics (Cassandra and R)
- Test-specific analytics and charting
- Inkless wafer map editing/merging/exporting
- Online and offline rules for quality and reliability